Proceedings of the 11th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis

Proceedings of the 11th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis Login for the JSON version of this page.

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Title: Proceedings of the 11th European Symposium on the Reliability of Electron Devices Failure Physics and Analysis
ISBN-10: 0-08-043915-2
ISBN-13: 978-0-08-043915-0
Author(s): L.J. Balk
Publisher: PERGAMON PRESS
Published: 2000
Format: Hardcover
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Pages: 394
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Description

Metadata

EAN: 9780080439150
ASIN: 0080439152
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 08
Publication: 043915
Check Digit: 0
Formatted: 978-0-08-043915-0

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