Applications of X Ray Topographic Methods to Materials Science

Applications of X Ray Topographic Methods to Materials Science Login for the JSON version of this page.

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Title: Applications of X Ray Topographic Methods to Materials Science
ISBN-10: 0-306-41838-X
ISBN-13: 978-0-306-41838-9
Author(s): Sigmund Weissmann, Francoise Balibar, Jean Francois Petroff
Publisher: Springer
Published: 1984
Format: Hardcover
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Pages: 747
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Description

Metadata

EAN: 9780306418389
ASIN: 030641838X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 306
Publication: 41838
Check Digit: 9
Formatted: 978-0-306-41838-9

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