Defect Induced Magnetism in Oxide Semiconductors

Defect Induced Magnetism in Oxide Semiconductors
Defect Induced Magnetism in Oxide Semiconductors Login for the JSON version of this page.
Average: 0.00, 0 Ratings
Title
Defect Induced Magnetism in Oxide Semiconductors
ISBN-10
0-323-90908-6
ISBN-13
978-0-323-90908-2
Author(s)
Parmod Kumar, Vinod Kumar, Jitendra Pal Singh
Publisher
Elsevier Science & Technology
Published
2022
Format
Subtitle
Login for full book details.
Series
Login to see series details.
Imprint
Login for imprint details.
Pages
834
Language
Login for language details.
Subjects
Login for subjects details.
Genre
Login for genre details.
Description

Login for description.

Metadata
EAN
9780323909082
ASIN
0323909086
Prefix
978
Group
0
Group Name
English language
Group Identifier
978-0
Registrant
323
Publication
90908
Check Digit
2
Formatted
978-0-323-90908-2

Related Articles from our Blog

What is an EAN and How Does it Relate to an ISBN?

If you’ve ever purchased a product online or in a store, you’ve likely come across a barcode. Behind these barcodes lies a standardized system that makes modern commerce possible. Two key codes often encountered are the EAN (European Article Number) and ISBN (International Standard Book Number). But what are they, how are they connected, and why are they so crucial? Let’s explore.

Read More