Characterization Testing Measurement and Metrology

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Title: Characterization Testing Measurement and Metrology
ISBN-10: 0-367-27515-5
ISBN-13: 978-0-367-27515-0
Author(s): Chander Prakash, Sunpreet Singh, J. Paulo Davim
Publisher: Taylor & Francis Group
Published: 2020
Format
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Pages: 977
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Description

Metadata

EAN: 9780367275150
ASIN: 0367275155
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 367
Publication: 27515
Check Digit: 0
Formatted: 978-0-367-27515-0

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