Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents NanoScience and Technology

Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents NanoScience and Technology Login for the JSON version of this page.

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Title: Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents NanoScience and Technology
ISBN-10: 0-387-37231-8
ISBN-13: 978-0-387-37231-0
Author(s): Adam Foster, Werner A. Hofer
Publisher: Springer
Published: 2006
Format
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Pages: 495
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Description

Metadata

EAN: 9780387372310
ASIN: 0387372318
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 387
Publication: 37231
Check Digit: 0
Formatted: 978-0-387-37231-0

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