Characterization of epitaxial semiconductor films

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Title: Characterization of epitaxial semiconductor films
ISBN-10: 0-444-41438-X
ISBN-13: 978-0-444-41438-0
Author(s)
Publisher: Elsevier Scientific Pub. Co.
Published: 1976
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Pages: 609
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Description

Metadata

EAN: 9780444414380
ASIN: 044441438X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 444
Publication: 41438
Check Digit: 0
Formatted: 978-0-444-41438-0

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