Reliability Wearout Mechanisms in Advanced CMOS Technologies

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Title: Reliability Wearout Mechanisms in Advanced CMOS Technologies
ISBN-10: 0-470-45525-X
ISBN-13: 978-0-470-45525-8
Author(s): Rolf Peter Vollertsen, Jordi Sune, Alvin W. Strong, Ernest Y. Wu, Timothy D. Sullivan
Publisher: Wiley & Sons, Incorporated, John
Published: 2009
Format
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Pages: 491
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Description

Metadata

EAN: 9780470455258
ASIN: 047045525X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 470
Publication: 45525
Check Digit: 8
Formatted: 978-0-470-45525-8

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