Reliability Wearout Mechanisms in Advanced Cmos Technologies

Reliability Wearout Mechanisms in Advanced Cmos Technologies Login for the JSON version of this page.

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Title: Reliability Wearout Mechanisms in Advanced Cmos Technologies
ISBN-10: 0-470-45526-8
ISBN-13: 978-0-470-45526-5
Author(s): Jordi Sune, Rolf Peter Vollertsen, Alvin W. Strong, Ernest Y. Wu
Publisher: IEEE Computer Society Press
Published: 2025
Format: Gedruckter Zugangscode
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Pages: 715
Language: Login for language details.
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Description

Metadata

EAN: 9780470455265
ASIN: 0470455268
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 470
Publication: 45526
Check Digit: 5
Formatted: 978-0-470-45526-5

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