Reliability wearout mechanisms in advanced CMOS technologies

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Title: Reliability wearout mechanisms in advanced CMOS technologies
ISBN-10: 0-471-73172-2
ISBN-13: 978-0-471-73172-6
Author(s): Alvin Wayne Strong, Jordi Sune, Guiseppe La Rosa, Alvin W. Strong, Ernest Y. Wu, Rolf Peter Vollertsen
Publisher: IEEE Press, Ieee, Wiley
Published: 2009
Format: Hardcover
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Pages: 571
Language: Login for language details.
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Description

Metadata

EAN: 9780471731726
ASIN: 0471731722
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 471
Publication: 73172
Check Digit: 6
Formatted: 978-0-471-73172-6

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