Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks Login for the JSON version of this page.
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Title
Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks
ISBN-10
0-521-45346-1
ISBN-13
978-0-521-45346-2
Author(s)
Kenneth Pye, David H. Krinsley, N. Keith Tovey, Sam Boggs Jr
Publisher
Cambridge University Press
Published
1998
Format
Hardcover
Subtitle
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Series
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Imprint
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Pages
279
Language
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Subjects
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Description

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Metadata
EAN
9780521453462
ASIN
0521453461
Prefix
978
Group
0
Group Name
English language
Group Identifier
978-0
Registrant
521
Publication
45346
Check Digit
2
Formatted
978-0-521-45346-2

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