Nonlinear transistor model parameter extraction techniques

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Title: Nonlinear transistor model parameter extraction techniques
ISBN-10: 0-521-76210-3
ISBN-13: 978-0-521-76210-6
Author(s): Matthias Rudolph, David E. Root, Christian Fager
Publisher: Cambridge University Press
Published: 2011
Format
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Pages: 938
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Metadata

EAN: 9780521762106
ASIN: 0521762103
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 521
Publication: 76210
Check Digit: 6
Formatted: 978-0-521-76210-6

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