Proceedings of the 2002 IEEE International Workshop on Memory Technology Design and Testing

Proceedings of the 2002 IEEE International Workshop on Memory Technology Design and Testing Login for the JSON version of this page.

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Title: Proceedings of the 2002 IEEE International Workshop on Memory Technology Design and Testing
ISBN-10: 0-7695-1617-3
ISBN-13: 978-0-7695-1617-2
Author(s): IEEE International Workshop On Memory Technology Design And Testing 10th 2002 Isle Of Bendor France
Publisher: IEEE Computer Society, IEEE Computer Society Pr
Published: 2002
Format: Paperback
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Pages: 378
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Description

Metadata

EAN: 9780769516172
ASIN: 0769516173
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 7695
Publication: 1617
Check Digit: 2
Formatted: 978-0-7695-1617-2

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