2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology

2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology Login for the JSON version of this page.

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Title: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology
ISBN-10: 0-7803-9726-6
ISBN-13: 978-0-7803-9726-2
Author(s): Tunisia International Conference On Design Test Of Integrated Systems In Nanoscale Technology 1st 2006 Tunis
Publisher: Institute of Electrical and Electronics Engineers
Published: 2006
Format
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Pages: 686
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Description

Metadata

EAN: 9780780397262
ASIN: 0780397266
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 7803
Publication: 9726
Check Digit: 2
Formatted: 978-0-7803-9726-2

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