Twenty Fifth Anniversary Compendium International Test Conference

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Title: Twenty Fifth Anniversary Compendium International Test Conference
ISBN-10: 0-8186-6617-X
ISBN-13: 978-0-8186-6617-9
Author(s): Paul H. Bardell, Ken Parker, Rudy Garcia
Publisher: Institute of Electrical & Electronics Enginee
Published: 1994
Format: Paperback
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Pages: 631
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Description

Metadata

EAN: 9780818666179
ASIN: 081866617X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 8186
Publication: 6617
Check Digit: 9
Formatted: 978-0-8186-6617-9

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