Testing Packaging Reliability and Applications of Semiconductor Lasers IV Proceedings of Spie the International Society for Optical Engineering V. 3626

Testing Packaging Reliability and Applications of Semiconductor Lasers IV Proceedings of Spie the International Society for Optical Engineering V. 3626 Login for the JSON version of this page.

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Title: Testing Packaging Reliability and Applications of Semiconductor Lasers IV Proceedings of Spie the International Society for Optical Engineering V. 3626
ISBN-10: 0-8194-3096-X
ISBN-13: 978-0-8194-3096-0
Author(s)
Publisher: SPIE-International Society for Optical Engine
Published: 1999
Format: Paperback
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Pages: 119
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Description

Metadata

EAN: 9780819430960
ASIN: 081943096X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 8194
Publication: 3096
Check Digit: 0
Formatted: 978-0-8194-3096-0

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