Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II

Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II Login for the JSON version of this page.

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Title: Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II
ISBN-10: 0-8194-5883-X
ISBN-13: 978-0-8194-5883-4
Author(s): SPIE
Publisher: SPIE-International Society for Optical Engine
Published: 2005
Format: Paperback
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Pages: 108
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Description

Metadata

EAN: 9780819458834
ASIN: 081945883X
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 8194
Publication: 5883
Check Digit: 4
Formatted: 978-0-8194-5883-4

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