Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II
Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II Login for the JSON version of this page.
- Title
- Advanced Characterization Techniques for Optics Semiconductors and Nanotechnologies II
- ISBN-10
- 0-8194-5883-X
- ISBN-13
- 978-0-8194-5883-4
- Author(s)
- SPIE
- Publisher
- SPIE-International Society for Optical Engine
- Published
- 2005
- Format
- Paperback
- Subtitle
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- Series
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- Imprint
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- Pages
- 108
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9780819458834
- ASIN
- 081945883X
- Prefix
- 978
- Group
- 0
- Group Name
- English language
- Group Identifier
- 978-0
- Registrant
- 8194
- Publication
- 5883
- Check Digit
- 4
- Formatted
- 978-0-8194-5883-4