Two and Three dimensional Methods for Inspection and Metrology SPIE Conference Proceedings

Two and Three dimensional Methods for Inspection and Metrology SPIE Conference Proceedings Login for the JSON version of this page.

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Title: Two and Three dimensional Methods for Inspection and Metrology SPIE Conference Proceedings
ISBN-10: 0-8194-6024-9
ISBN-13: 978-0-8194-6024-0
Author(s): Kevin G. Harding
Publisher: SPIE-International Society for Optical Engine
Published: 2005
Format: Paperback
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Pages: 760
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Description

Metadata

EAN: 9780819460240
ASIN: 0819460249
Prefix: 978
Group: 0
Group Name: English language
Group Identifier: 978-0
Registrant: 8194
Publication: 6024
Check Digit: 0
Formatted: 978-0-8194-6024-0

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