Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452

Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452
Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452 Login for the JSON version of this page.
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Title
Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452
ISBN-10
0-89252-487-1
ISBN-13
978-0-89252-487-7
Author(s)
Fred H. Pollak, Robert S. Bauer
Publisher
SPIE--The International Society for Optical Engineering, SPIE--the International Society for Optical Engineering
Published
1984
Format
Paperback
Subtitle
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Series
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Imprint
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Pages
721
Language
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Subjects
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Genre
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Description

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Metadata
EAN
9780892524877
ASIN
0892524871
Prefix
978
Group
0
Group Name
English language
Group Identifier
978-0
Registrant
89252
Publication
487
Check Digit
7
Formatted
978-0-89252-487-7

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