Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452
Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452 Login for the JSON version of this page.
- Title
- Spectroscopic Characterization Techniques for Semiconductor Technology Proceedings of Spie The International Society for Optical Engineering Vol 452
- ISBN-10
- 0-89252-487-1
- ISBN-13
- 978-0-89252-487-7
- Author(s)
- Fred H. Pollak, Robert S. Bauer
- Publisher
- SPIE--The International Society for Optical Engineering, SPIE--the International Society for Optical Engineering
- Published
- 1984
- Format
- Paperback
- Subtitle
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- Series
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- Imprint
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- Pages
- 721
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9780892524877
- ASIN
- 0892524871
- Prefix
- 978
- Group
- 0
- Group Name
- English language
- Group Identifier
- 978-0
- Registrant
- 89252
- Publication
- 487
- Check Digit
- 7
- Formatted
- 978-0-89252-487-7