Advanced VLSI Design and Testability Issues

Advanced VLSI Design and Testability Issues Login for the JSON version of this page.

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Title: Advanced VLSI Design and Testability Issues
ISBN-10: 1-000-16815-8
ISBN-13: 978-1-000-16815-0
Author(s): Sushanta Kumar Mohapatra, Sobhit Saxena, Suman Lata Tripathi
Publisher: Taylor & Francis Group
Published: 2020
Format
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Pages: 219
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Description

Metadata

EAN: 9781000168150
ASIN: 1000168158
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 000
Publication: 16815
Check Digit: 0
Formatted: 978-1-000-16815-0

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