Materials Reliability in Microelectronics II

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Title: Materials Reliability in Microelectronics II
ISBN-10: 1-107-40968-3
ISBN-13: 978-1-107-40968-2
Author(s): J. R. Lloyd, C. V. Thompson
Publisher: University of Cambridge ESOL Examinations
Published: 2014
Format
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Pages: 106
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Description

Metadata

EAN: 9781107409682
ASIN: 1107409683
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 107
Publication: 40968
Check Digit: 2
Formatted: 978-1-107-40968-2

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