Measurement Technology for Micro Nanometer Devices

Measurement Technology for Micro Nanometer Devices
Measurement Technology for Micro Nanometer Devices Login for the JSON version of this page.
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Title
Measurement Technology for Micro Nanometer Devices
ISBN-10
1-118-71796-1
ISBN-13
978-1-118-71796-7
Author(s)
Jingdong Chen, Liguo Chen, Dachao Li, Wendong Zhang, Xiujian Chou, Zongmin Ma, Haifei Bao, Chenyang Xue, Tielin Shi
Publisher
Wiley
Published
2017
Format
hardcover
Subtitle
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Series
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Imprint
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Pages
199
Language
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Subjects
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Description

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Metadata
EAN
9781118717967
ASIN
1118717961
Prefix
978
Group
1
Group Name
English language
Group Identifier
978-1
Registrant
118
Publication
71796
Check Digit
7
Formatted
978-1-118-71796-7

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