Measurement Technology for Micro Nanometer Devices
Measurement Technology for Micro Nanometer Devices Login for the JSON version of this page.
- Title
- Measurement Technology for Micro Nanometer Devices
- ISBN-10
- 1-118-71796-1
- ISBN-13
- 978-1-118-71796-7
- Author(s)
- Jingdong Chen, Liguo Chen, Dachao Li, Wendong Zhang, Xiujian Chou, Zongmin Ma, Haifei Bao, Chenyang Xue, Tielin Shi
- Publisher
- Wiley
- Published
- 2017
- Format
- hardcover
- Subtitle
- Login for full book details.
- Series
- Login to see series details.
- Imprint
- Login for imprint details.
- Pages
- 199
- Language
- Login for language details.
- Subjects
- Login for subjects details.
- Genre
- Login for genre details.
Description
Login for description.
Metadata
- EAN
- 9781118717967
- ASIN
- 1118717961
- Prefix
- 978
- Group
- 1
- Group Name
- English language
- Group Identifier
- 978-1
- Registrant
- 118
- Publication
- 71796
- Check Digit
- 7
- Formatted
- 978-1-118-71796-7