Nanometer Scale Defect Detection Using Polarized Light

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Title: Nanometer Scale Defect Detection Using Polarized Light
ISBN-10: 1-119-32968-X
ISBN-13: 978-1-119-32968-8
Author(s): Pierre Richard Dahoo, Abdelkhalak El Hami, Philippe Pougnet
Publisher: Wiley & Sons, Incorporated, John
Published: 2016
Format
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Pages: 639
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Description

Metadata

EAN: 9781119329688
ASIN: 111932968X
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 119
Publication: 32968
Check Digit: 8
Formatted: 978-1-119-32968-8

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