Thermal Aware Testing of Digital VLSI Circuits and Systems

Thermal Aware Testing of Digital VLSI Circuits and Systems Login for the JSON version of this page.

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Title: Thermal Aware Testing of Digital VLSI Circuits and Systems
ISBN-10: 1-351-22777-7
ISBN-13: 978-1-351-22777-3
Author(s): Santanu Chattopadhyay
Publisher: Taylor & Francis Group
Published: 2018
Format
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Pages: 513
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Description

Metadata

EAN: 9781351227773
ASIN: 1351227777
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 351
Publication: 22777
Check Digit: 3
Formatted: 978-1-351-22777-3

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