Defects in High k Gate Dielectric Stacks Nano Electronic Semiconductor Devices NATO Science Series II Mathematics Physics and Chemistry NATO Science ... II Mathematics Physics and Chemistry

Defects in High k Gate Dielectric Stacks Nano Electronic Semiconductor Devices NATO Science Series II Mathematics Physics and Chemistry NATO Science ... II Mathematics Physics and Chemistry Login for the JSON version of this page.

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Title: Defects in High k Gate Dielectric Stacks Nano Electronic Semiconductor Devices NATO Science Series II Mathematics Physics and Chemistry NATO Science ... II Mathematics Physics and Chemistry
ISBN-10: 1-4020-4365-1
ISBN-13: 978-1-4020-4365-9
Author(s): NATO Advanced Research Workshop On Defects In High K Dielectric Nano Electronic Semiconductor Devices 2005 Saint Petersburg Russia, Evgeni Gusev
Publisher: Springer
Published: 2006
Format: Hardcover
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Pages: 894
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Description

Metadata

EAN: 9781402043659
ASIN: 1402043651
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4020
Publication: 4365
Check Digit: 9
Formatted: 978-1-4020-4365-9

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