Design for Manufacturability and Yield for Nano Scale CMOS Series on Integrated Circuits and Systems

Design for Manufacturability and Yield for Nano Scale CMOS Series on Integrated Circuits and Systems Login for the JSON version of this page.

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Title: Design for Manufacturability and Yield for Nano Scale CMOS Series on Integrated Circuits and Systems
ISBN-10: 1-4020-5187-5
ISBN-13: 978-1-4020-5187-6
Author(s): Jamil Kawa, Charles Chiang
Publisher: Springer
Published: 2007
Format: Hardcover
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Pages: 733
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Description

Metadata

EAN: 9781402051876
ASIN: 1402051875
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4020
Publication: 5187
Check Digit: 6
Formatted: 978-1-4020-5187-6

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