Electron Microscopy and Analysis Third Edition

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Title: Electron Microscopy and Analysis Third Edition
ISBN-10: 1-4200-1725-X
ISBN-13: 978-1-4200-1725-0
Author(s): John Humphreys, Richard Beanland, Peter J. Goodhew
Publisher: Taylor & Francis Group
Published: 2000
Format
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Pages: 311
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Description

Metadata

EAN: 9781420017250
ASIN: 142001725X
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4200
Publication: 1725
Check Digit: 0
Formatted: 978-1-4200-1725-0

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