2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT)

2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) Login for the JSON version of this page.

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Title: 2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT)
ISBN-10: 1-4244-0582-3
ISBN-13: 978-1-4244-0582-4
Author(s): International Symposium On VLSI Design Automation And Test 2007 Hsin Chu Shih Taiwan
Publisher: IEEE, ITRI
Published: 2007
Format
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Pages: 148
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Description

Metadata

EAN: 9781424405824
ASIN: 1424405823
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4244
Publication: 0582
Check Digit: 4
Formatted: 978-1-4244-0582-4

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