Interfacial Compatibility In Microelectronics Moving Away From The Trial And Error Approach Tomi Laurila Et Al

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Title: Interfacial Compatibility In Microelectronics Moving Away From The Trial And Error Approach Tomi Laurila Et Al
ISBN-10: 1-4471-2469-3
ISBN-13: 978-1-4471-2469-6
Author(s)
Publisher: Springer
Published: 2012
Format
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Pages: 157
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Description

Metadata

EAN: 9781447124696
ASIN: 1447124693
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4471
Publication: 2469
Check Digit: 6
Formatted: 978-1-4471-2469-6

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