Analog Ic Reliability In Nanometer Cmos
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- Title
- Analog Ic Reliability In Nanometer Cmos
- ISBN-10
- 1-4614-6162-6
- ISBN-13
- 978-1-4614-6162-3
- Author(s)
- Publisher
- Springer-Verlag New York Inc.
- Published
- 2013
- Format
- Subtitle
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- Series
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- Imprint
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- Pages
- 634
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9781461461623
- ASIN
- 1461461626
- Prefix
- 978
- Group
- 1
- Group Name
- English language
- Group Identifier
- 978-1
- Registrant
- 4614
- Publication
- 6162
- Check Digit
- 3
- Formatted
- 978-1-4614-6162-3