Next Generation System Wide Liquidity Stress Testing

Next Generation System Wide Liquidity Stress Testing Login for the JSON version of this page.

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Title: Next Generation System Wide Liquidity Stress Testing
ISBN-10: 1-4639-9552-0
ISBN-13: 978-1-4639-9552-2
Author(s): Heiko Hesse, Claus Puhr, Christian Schmieder, Andre Santos, Salih N. Neftci
Publisher: International Monetary Fund
Published: 2012
Format
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Pages: 505
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Description

Metadata

EAN: 9781463995522
ASIN: 1463995520
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4639
Publication: 9552
Check Digit: 2
Formatted: 978-1-4639-9552-2

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