Advanced Scanning Electron Microscopy and X Ray Microanalysis

Advanced Scanning Electron Microscopy and X Ray Microanalysis Login for the JSON version of this page.

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Title: Advanced Scanning Electron Microscopy and X Ray Microanalysis
ISBN-10: 1-4757-9028-7
ISBN-13: 978-1-4757-9028-3
Author(s): Patrick Echlin, C.E. Fiori, Joseph Goldstein
Publisher: Springer
Published: 2013
Format: paperback
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Pages: 615
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Description

Metadata

EAN: 9781475790283
ASIN: 1475790287
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4757
Publication: 9028
Check Digit: 3
Formatted: 978-1-4757-9028-3

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