Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs Login for the JSON version of this page.

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Title: Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
ISBN-10: 1-4899-8787-8
ISBN-13: 978-1-4899-8787-7
Author(s): Hao Yu, Ruijing Shen, Sheldon X. D Tan
Publisher: Springer
Published: 2014
Format: paperback
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Pages: 821
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Description

Metadata

EAN: 9781489987877
ASIN: 1489987878
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4899
Publication: 8787
Check Digit: 7
Formatted: 978-1-4899-8787-7

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