Advanced Transmission Electron Microscopy

Advanced Transmission Electron Microscopy Login for the JSON version of this page.

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Title: Advanced Transmission Electron Microscopy
ISBN-10: 1-4939-8249-4
ISBN-13: 978-1-4939-8249-3
Author(s): Jian Min Zuo, John C.H. Spence
Publisher: Springer
Published: 2018
Format: paperback
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Pages: 785
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Description

Metadata

EAN: 9781493982493
ASIN: 1493982494
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 4939
Publication: 8249
Check Digit: 3
Formatted: 978-1-4939-8249-3

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