Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding

Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding Login for the JSON version of this page.
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Title
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding
ISBN-10
1-56677-100-5
ISBN-13
978-1-56677-100-9
Author(s)
V. Swaminathan, Symposium On Nondestructive Wafer Characterization For Compound Semiconductor Materials 1995 Reno Nevada
Publisher
Electrochemical Society
Published
1995
Format
Paperback
Subtitle
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Series
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Imprint
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Pages
764
Language
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Subjects
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Description

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Metadata
EAN
9781566771009
ASIN
1566771005
Prefix
978
Group
1
Group Name
English language
Group Identifier
978-1
Registrant
56677
Publication
100
Check Digit
9
Formatted
978-1-56677-100-9

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