Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding
Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding Login for the JSON version of this page.
- Title
- Proceedings of the Symposium on Nondestructive Wafer Characterization for Compound Materials and the Twenty Second State Of The Art Program on Compoun Proceeding
- ISBN-10
- 1-56677-100-5
- ISBN-13
- 978-1-56677-100-9
- Author(s)
- V. Swaminathan, Symposium On Nondestructive Wafer Characterization For Compound Semiconductor Materials 1995 Reno Nevada
- Publisher
- Electrochemical Society
- Published
- 1995
- Format
- Paperback
- Subtitle
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- Series
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- Imprint
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- Pages
- 764
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9781566771009
- ASIN
- 1566771005
- Prefix
- 978
- Group
- 1
- Group Name
- English language
- Group Identifier
- 978-1
- Registrant
- 56677
- Publication
- 100
- Check Digit
- 9
- Formatted
- 978-1-56677-100-9