ALTECH 95 Analytical techniques for semiconductor materials and process characterization II
ALTECH 95 Analytical techniques for semiconductor materials and process characterization II Login for the JSON version of this page.
- Title
- ALTECH 95 Analytical techniques for semiconductor materials and process characterization II
- ISBN-10
- 1-56677-122-6
- ISBN-13
- 978-1-56677-122-1
- Author(s)
- Satellite Symposium To ESSDERC 95 1995 Hague Netherlands
- Publisher
- Electrochemical Society
- Published
- 1995
- Format
- Unknown Binding
- Subtitle
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- Series
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- Imprint
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- Pages
- 539
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9781566771221
- ASIN
- 1566771226
- Prefix
- 978
- Group
- 1
- Group Name
- English language
- Group Identifier
- 978-1
- Registrant
- 56677
- Publication
- 122
- Check Digit
- 1
- Formatted
- 978-1-56677-122-1