Wafer level testing and test during burn in for integrated circuits Sudarshan Bahukudumbi Krishnendu Chakrabarty

Wafer level testing and test during burn in for integrated circuits Sudarshan Bahukudumbi Krishnendu Chakrabarty Login for the JSON version of this page.

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Title: Wafer level testing and test during burn in for integrated circuits Sudarshan Bahukudumbi Krishnendu Chakrabarty
ISBN-10: 1-59693-989-3
ISBN-13: 978-1-59693-989-9
Author(s): Sudarshan Bahukudumbi
Publisher: Artech House
Published: 2010
Format
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Pages: 580
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Description

Metadata

EAN: 9781596939899
ASIN: 1596939893
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 59693
Publication: 989
Check Digit: 9
Formatted: 978-1-59693-989-9

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