Reliability and Materials Issues of III V and II VI Semiconductor Optical and Electron Devices and Materials II
Reliability and Materials Issues of III V and II VI Semiconductor Optical and Electron Devices and Materials II Login for the JSON version of this page.
- Title
- Reliability and Materials Issues of III V and II VI Semiconductor Optical and Electron Devices and Materials II
- ISBN-10
- 1-60511-409-X
- ISBN-13
- 978-1-60511-409-5
- Author(s)
- Kenji Shiojima, Edwin Piner, Osamu Ueda, Mitsuo Fukuda
- Publisher
- Brand: Materials Research Society, Materials Research Society
- Published
- 2012
- Format
- Subtitle
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- Series
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- Imprint
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- Pages
- 773
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9781605114095
- ASIN
- 160511409X
- Prefix
- 978
- Group
- 1
- Group Name
- English language
- Group Identifier
- 978-1
- Registrant
- 60511
- Publication
- 409
- Check Digit
- 5
- Formatted
- 978-1-60511-409-5