Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization

Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization Login for the JSON version of this page.

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Title: Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
ISBN-10: 1-83968-229-9
ISBN-13: 978-1-83968-229-2
Author(s): Samir Kumar, Chandra Shakher Pathak
Publisher: IntechOpen
Published: 2022
Format
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Pages: 286
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Description

Metadata

EAN: 9781839682292
ASIN: 1839682299
Prefix: 978
Group: 1
Group Name: English language
Group Identifier: 978-1
Registrant: 83968
Publication: 229
Check Digit: 2
Formatted: 978-1-83968-229-2

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