Intrinsic Point Defects Impurities and Their Diffusion in Silicon Computational Microelectronics

Intrinsic Point Defects Impurities and Their Diffusion in Silicon Computational Microelectronics Login for the JSON version of this page.

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Title: Intrinsic Point Defects Impurities and Their Diffusion in Silicon Computational Microelectronics
ISBN-10: 3-211-20687-6
ISBN-13: 978-3-211-20687-4
Author(s): Peter Pichler
Publisher: Springer
Published: 2004
Format: Hardcover
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Pages: 325
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Description

Metadata

EAN: 9783211206874
ASIN: 3211206876
Prefix: 978
Group: 3
Group Name: German language
Group Identifier: 978-3
Registrant: 211
Publication: 20687
Check Digit: 4
Formatted: 978-3-211-20687-4

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