Metrology and Standardization for Nanotechnology

Metrology and Standardization for Nanotechnology Login for the JSON version of this page.

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Title: Metrology and Standardization for Nanotechnology
ISBN-10: 3-527-34039-4
ISBN-13: 978-3-527-34039-2
Author(s): Marcel Van De Voorde, Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita
Publisher: Wiley-VCH Verlag GmbH
Published: 2017
Format
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Pages: 618
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Description

Metadata

EAN: 9783527340392
ASIN: 3527340394
Prefix: 978
Group: 3
Group Name: German language
Group Identifier: 978-3
Registrant: 527
Publication: 34039
Check Digit: 2
Formatted: 978-3-527-34039-2

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