Amplitude modulation atomic force microscopy

Amplitude modulation atomic force microscopy Login for the JSON version of this page.

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Title: Amplitude modulation atomic force microscopy
ISBN-10: 3-527-63219-0
ISBN-13: 978-3-527-63219-0
Author(s): Ricardo Castro Garcia
Publisher: John Wiley [distributor], Wiley-VCH
Published: 2010
Format: [electronic resource] /
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Pages: 716
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Metadata

EAN: 9783527632190
ASIN: 3527632190
Prefix: 978
Group: 3
Group Name: German language
Group Identifier: 978-3
Registrant: 527
Publication: 63219
Check Digit: 0
Formatted: 978-3-527-63219-0

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