VLSI Design and Test

VLSI Design and Test
VLSI Design and Test Login for the JSON version of this page.
Average: 0.00, 0 Ratings
Title
VLSI Design and Test
ISBN-10
3-642-42025-7
ISBN-13
978-3-642-42025-2
Author(s)
Vijay Laxmi, Mark Zwolinski, Singh Manoj Gaur
Publisher
Springer
Published
2013
Format
paperback
Subtitle
Login for full book details.
Series
Login to see series details.
Imprint
Login for imprint details.
Pages
535
Language
Login for language details.
Subjects
Login for subjects details.
Genre
Login for genre details.
Description

Login for description.

Metadata
EAN
9783642420252
ASIN
3642420257
Prefix
978
Group
3
Group Name
German language
Group Identifier
978-3
Registrant
642
Publication
42025
Check Digit
2
Formatted
978-3-642-42025-2

Related Articles from our Blog

What is an EAN and How Does it Relate to an ISBN?

If you’ve ever purchased a product online or in a store, you’ve likely come across a barcode. Behind these barcodes lies a standardized system that makes modern commerce possible. Two key codes often encountered are the EAN (European Article Number) and ISBN (International Standard Book Number). But what are they, how are they connected, and why are they so crucial? Let’s explore.

Read More