Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials Login for the JSON version of this page.
- Title
- Transmission Electron Microscopy and Diffractometry of Materials
- ISBN-10
- 3-662-04516-8
- ISBN-13
- 978-3-662-04516-9
- Author(s)
- James M. Howe, Brent Fultz
- Publisher
- Springer London, Limited
- Published
- 2013
- Format
- Subtitle
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- Series
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- Imprint
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- Pages
- 904
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9783662045169
- ASIN
- 3662045168
- Prefix
- 978
- Group
- 3
- Group Name
- German language
- Group Identifier
- 978-3
- Registrant
- 662
- Publication
- 04516
- Check Digit
- 9
- Formatted
- 978-3-662-04516-9