Adaptive Bayes sche Stichprobensysteme Fur Die Gut Schlecht Prufung

Adaptive Bayes sche Stichprobensysteme Fur Die Gut Schlecht Prufung Login for the JSON version of this page.

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Title: Adaptive Bayes sche Stichprobensysteme Fur Die Gut Schlecht Prufung
ISBN-10: 3-662-11027-X
ISBN-13: 978-3-662-11027-0
Author(s): Ulrich Rendtel, Hans Joachim Lenz
Publisher: Physica-Verlag
Published: 2013
Format
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Pages: 920
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Description

Metadata

EAN: 9783662110270
ASIN: 366211027X
Prefix: 978
Group: 3
Group Name: German language
Group Identifier: 978-3
Registrant: 662
Publication: 11027
Check Digit: 0
Formatted: 978-3-662-11027-0

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