Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena
Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena Login for the JSON version of this page.
- Title
- Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena
- ISBN-10
- 3-908450-39-X
- ISBN-13
- 978-3-908450-39-9
- Author(s)
- Publisher
- Scietec Publications Ltd
- Published
- 1998
- Format
- Paperback
- Subtitle
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- Series
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- Imprint
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- Pages
- 795
- Language
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- Subjects
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- Genre
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Description
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Metadata
- EAN
- 9783908450399
- ASIN
- 390845039X
- Prefix
- 978
- Group
- 3
- Group Name
- German language
- Group Identifier
- 978-3
- Registrant
- 908450
- Publication
- 39
- Check Digit
- 9
- Formatted
- 978-3-908450-39-9