Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena

Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena Login for the JSON version of this page.

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Title: Beam Injection Assessment of Defects in Semiconductors Solid State Phenomena
ISBN-10: 3-908450-39-X
ISBN-13: 978-3-908450-39-9
Author(s)
Publisher: Scietec Publications Ltd
Published: 1998
Format: Paperback
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Pages: 616
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Description

Metadata

EAN: 9783908450399
ASIN: 390845039X
Prefix: 978
Group: 3
Group Name: German language
Group Identifier: 978-3
Registrant: 908450
Publication: 39
Check Digit: 9
Formatted: 978-3-908450-39-9

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