High-resolution electron microscopy for materials science

High-resolution electron microscopy for materials science
High-resolution electron microscopy for materials science Login for the JSON version of this page.
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Title
High-resolution electron microscopy for materials science
ISBN-10
4-431-70234-2
ISBN-13
978-4-431-70234-4
Author(s)
D. Shindo
Publisher
Springer
Published
1998
Format
Subtitle
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Series
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Imprint
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Pages
651
Language
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Subjects
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Description

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Metadata
EAN
9784431702344
ASIN
4431702342
Prefix
978
Group
4
Group Name
Japan
Group Identifier
978-4
Registrant
431
Publication
70234
Check Digit
4
Formatted
978-4-431-70234-4

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