Design Analysis and Test of Logic Circuits Under Uncertainty

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Title: Design Analysis and Test of Logic Circuits Under Uncertainty
ISBN-10: 90-481-9645-0
ISBN-13: 978-90-481-9645-6
Author(s): Igor L. Markov, Hayes John P., Smita Krishnaswamy
Publisher: Springer
Published: 2012
Format: paperback
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Pages: 416
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Description

Metadata

EAN: 9789048196456
ASIN: 9048196450
Prefix: 978
Group: 90
Group Name: Netherlands
Group Identifier: 978-90
Registrant: 481
Publication: 9645
Check Digit: 6
Formatted: 978-90-481-9645-6

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