Diagnostic measurements in LSI VLSI integrated circuits production

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Title: Diagnostic measurements in LSI VLSI integrated circuits production
ISBN-10: 981-02-0282-2
ISBN-13: 978-981-02-0282-8
Author(s): Andrzej Jakubowski
Publisher: World Scientific
Published: 1991
Format
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Pages: 725
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Description

Metadata

EAN: 9789810202828
ASIN: 9810202822
Prefix: 978
Group: 981
Group Name: Singapore
Group Identifier: 978-981
Registrant: 02
Publication: 0282
Check Digit: 8
Formatted: 978-981-02-0282-8

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