Thermal Reliability of Power Semiconductor Device in the Renewable Energy System

Thermal Reliability of Power Semiconductor Device in the Renewable Energy System Login for the JSON version of this page.

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Title: Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
ISBN-10: 981-19-3131-3
ISBN-13: 978-981-19-3131-4
Author(s): Jun Zhang, Cheng Qian, Gaoxian Li, Xiong Du, Yaoyi Yu
Publisher: Springer
Published: 2022
Format
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Pages: 654
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Description

Metadata

EAN: 9789811931314
ASIN: 9811931313
Prefix: 978
Group: 981
Group Name: Singapore
Group Identifier: 978-981
Registrant: 19
Publication: 3131
Check Digit: 4
Formatted: 978-981-19-3131-4

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