Oehrlein Books

Materials, Technology And Reliability For Advanced Interconnects And Low-K Dielectrics Proce...
Materials, Technology And Reliability For Advanced Interconnects And Low-K Dielectrics Proce...

By G. S, Y. C., K, Joo, G. S. Oehrlein, Materials Research Society. Fall Meeting Symposium D, Oehrlein, Maex

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Mechanical Properties -- On The Mechanical Integrity Of Ultra Low Dielectric Constant Materials For Use In Ulsi Beol Structures / E.o. Shaffer Ii, K.e. Howard, M.e. Mills, P.h. Townsend Iii D1.1 --...

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